![]() The RHBD version of the device will be available for the next higher radiation level that the standard devices are qualified to on the QPL. The RHBD die are form, fit, and function equivalent to the standard device and are qualified to the same MIL-PRF-19500 slash sheet. This process allows Semicoa to take any of its transistors and improve the total dose performance while maintaining the same die geometry and junction profile. Semicoa has developed a Rad Hard By Design Bipolar Transistor Technology that can be applied to either NPN or PNP devices to improve the total dose hardness of the device to a minimum of 300 Krad with excellent wafer-to-wafer and lot-to-lot uniformity. Rad Hard By Design Bipolar Transistor Technology Semicoa has experience in a wide variety of radiation effects testing like: high dose rate total dose, low dose rate total dose, displacement damage, nuclear gamma dose rate testing in narrow and wide pulse, and single event effects testing. ![]() Semicoa specializes in taking on customer radiation requires in Selected Item Drawings and providing a fully compliant part, thus eliminating the lot jeopardy. Semicoa can perform almost any type of special radiation characterization or qualification needed for any of our products. Semicoa eliminates the need to re-test RHA devices in order to demonstrate program compliance. This approach was developed based on our customer’s program requirements and the methodology required for characterizing parts for usage on most military and space programs. All parameters and parameter deltas must meet their acceptance criteria at the 0.99/90% level in order for a wafer to be considered RHA by Semicoa. Furthermore, statistics are used for deciding if the wafer meets the radiation requirement by calculating the 0.99/90% tails of the distribution based on the small sample tested and comparing those tails to the upper of lower acceptance criteria for the parameter of interest. All of these acceptance criteria must be met when we test a wafer for the device to be classified as RHA Product. Semicoa uses the Group D end points as acceptance criteria and develops a radiation delta acceptance criteria by taking the Group D end point and subtracting the Group A endpoint to calculate a delta parameter acceptance criteria. MIL-PRF-19500 only requires a samples size of 1 for these wafers. ![]() Only the very largest die, those that come from wafers where we yield less than 500 die per wafer, at tested with a smaller samples size, of 5 per wafer. The maximum sample size required by MIL-PRF-19500 is 4 per wafer. All RHA devices are qualified with a larger samples size than what is required by MIL-PRF-19500 most of our RHA devices are qualified with a sample size of 11 per wafer. Semicoa currently has 42 unique 2N numbers available in various levels of RHA and the majority are qualified up to 300 Krad or JANSF level.Semicoa has the most stringent Radiation Hardness Assurance Program in the semiconductor market and has set the benchmark for qualifying RHA devices. Semicoa has the broadest Radiation Hardness Assured (RHA) Bipolar Transistor product offering on the MIL-PRF-19500 Qualified Part List (QPL). We have the in-house capability to perform most environmental and life tests required by MIL-PRF-19500 for JAN through JANS level transistors, including additional tests specific to customer requirements. Our line of Rad Hard devices are specifically designed to tolerate higher levels of radiation and are guaranteed at a high level of statistical performance (0.99/90%, KTL Statistics for each parameter and parameter delta), above and beyond what the industry requires for RHA qualification. All Semicoa products are designed to meet radiation hardness requirements. ![]()
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